James A. O'Donnell, Chris Connor, Tanmoy Pramanik, Jeff Hicks, Juan G. Alzate, Fatih Hamzaoglu, Justin Brockman, Oleg Golonzka, Kevin Fischer. eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]
Abstract is missing.