Field testing for cosmic ray soft errors in semiconductor memories

Timothy J. O Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh. Field testing for cosmic ray soft errors in semiconductor memories. IBM Journal of Research and Development, 40(1):41-50, 1996.

Abstract

Abstract is missing.