Ralph Oberhuber, Christoph Hechtl, Klaus Schimpf, Berthold Staufer. Bandgap yield loss due to dislocations on RFSiGe transceiver ICs: failure analysis, design. In Proceedings 2004 IEEE International SOC Conference, September 12-15, 2004, Hilton Santa Clara, CA, USA. pages 149-150, IEEE, 2004. [doi]
Abstract is missing.