Constrained ATPG for functional RTL circuits using F-Scan - researchr publication authors

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Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara. Constrained ATPG for functional RTL circuits using F-Scan. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 615-624, IEEE, 2010. [doi]

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