Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara. Constrained ATPG for functional RTL circuits using F-Scan. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 615-624, IEEE, 2010. [doi]
@inproceedings{ObienOF10, title = {Constrained ATPG for functional RTL circuits using F-Scan}, author = {Marie Engelene J. Obien and Satoshi Ohtake and Hideo Fujiwara}, year = {2010}, doi = {10.1109/TEST.2010.5699265}, url = {http://dx.doi.org/10.1109/TEST.2010.5699265}, researchr = {https://researchr.org/publication/ObienOF10}, cites = {0}, citedby = {0}, pages = {615-624}, booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010}, editor = {Ron Press and Erik H. Volkerink}, publisher = {IEEE}, isbn = {978-1-4244-7206-2}, }