Test Strategies for BIST at the Algorithmic and Register-Transfer Levels - researchr publication authors

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Kelly A. Ockunzzi, Christos A. Papachristou. Test Strategies for BIST at the Algorithmic and Register-Transfer Levels. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 65-70, ACM, 2001. [doi]

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