Kelly A. Ockunzzi, Christos A. Papachristou. Test Strategies for BIST at the Algorithmic and Register-Transfer Levels. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 65-70, ACM, 2001. [doi]
@inproceedings{OckunzziP01,
title = {Test Strategies for BIST at the Algorithmic and Register-Transfer Levels},
author = {Kelly A. Ockunzzi and Christos A. Papachristou},
year = {2001},
url = {http://jamaica.ee.pitt.edu/Archives/ProceedingArchives/Dac/Dac2001/papers/2001/dac01/pdffiles/05_3.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/OckunzziP01},
cites = {0},
citedby = {0},
pages = {65-70},
booktitle = {Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001},
publisher = {ACM},
isbn = {1-58113-297-2},
}