Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto, Takashi Sato, Takao Onoye. Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 861-864, IEEE, 2006. [doi]
Abstract is missing.