Measurement and Analysis of Inductive Coupling Noise in 90 nm Global Interconnects

Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye. Measurement and Analysis of Inductive Coupling Noise in 90 nm Global Interconnects. J. Solid-State Circuits, 43(3):718-728, 2008. [doi]

Abstract

Abstract is missing.