th control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs

Yasuhiro Ogasahara, Tadashi Nakagawa, Toshihiro Sekigawa, Toshiyuki Tsutsumi, Hanpei Koike. th control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs. IEICE Electronic Express, 12(15):20150460, 2015. [doi]

@article{OgasaharaNSTK15,
  title = {th control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs},
  author = {Yasuhiro Ogasahara and Tadashi Nakagawa and Toshihiro Sekigawa and Toshiyuki Tsutsumi and Hanpei Koike},
  year = {2015},
  url = {https://www.jstage.jst.go.jp/article/elex/12/15/12_12.20150460/_article},
  researchr = {https://researchr.org/publication/OgasaharaNSTK15},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {12},
  number = {15},
  pages = {20150460},
}