MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits

T. Ogihara, K. Muroi, G. Yonemori, S. Murai. MULTES/IS: An Effective and Reliable Test Generation System for Partial Scan and Non-Scan Synchronous Circuits. In DAC. pages 519-524, 1989. [doi]

Abstract

Abstract is missing.