Static Electromigration Analysis for Signal Interconnects

Chanhee Oh, David Blaauw, Murat R. Becer, Vladimir Zolotov, Rajendran Panda, Aurobindo Dasgupta. Static Electromigration Analysis for Signal Interconnects. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 377, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.