Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong. Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.