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Using class separation for feature analysis and combination of class-dependent features

Il-Seok Oh, Jin-Seon Lee, Ching Y. Suen. Using class separation for feature analysis and combination of class-dependent features. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 453-455, IEEE, 1998. [doi]

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Il-Seok Oh

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Jin-Seon Lee

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Ching Y. Suen

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