Il-Seok Oh, Jin-Seon Lee, Ching Y. Suen. Using class separation for feature analysis and combination of class-dependent features. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 453-455, IEEE, 1998. [doi]
@inproceedings{OhLS98,
title = {Using class separation for feature analysis and combination of class-dependent features},
author = {Il-Seok Oh and Jin-Seon Lee and Ching Y. Suen},
year = {1998},
doi = {10.1109/ICPR.1998.711178},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1998.711178},
researchr = {https://researchr.org/publication/OhLS98},
cites = {0},
citedby = {0},
pages = {453-455},
booktitle = {Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998},
editor = {Anil K. Jain and Svetha Venkatesh and Brian C. Lovell},
publisher = {IEEE},
isbn = {0-8186-8512-3},
}