Hiroyuki Ohde, Haruhiko Kaneko, Eiji Fujiwara. Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 175-183, IEEE Computer Society, 2006. [doi]
@inproceedings{OhdeKF06,
title = {Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems},
author = {Hiroyuki Ohde and Haruhiko Kaneko and Eiji Fujiwara},
year = {2006},
doi = {10.1109/DFT.2006.42},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.42},
researchr = {https://researchr.org/publication/OhdeKF06},
cites = {0},
citedby = {0},
pages = {175-183},
booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2706-X},
}