Masao Ohmatsu, Yuto Ohtera, Yuki Ikiri, Hiroyuki Yotsuyanagi, Shyue-Kung Lu, Masaki Hashizume. Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators. In IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. pages 49-53, IEEE, 2022. [doi]
Abstract is missing.