Kenji Ohmori, Ranga Hettiarachchi, Keisaku Yamada. Effect of substrate bias on frequency dependence of MOSFET noise intensity. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 342-345, IEEE, 2012. [doi]
Abstract is missing.