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Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering

Akio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. IEICE Transactions, 95-C(5):879-884, 2012. [doi]

Authors

Akio Ohta

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Yuta Goto

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Shingo Nishigaki

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Guobin Wei

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Hideki Murakami

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Seiichiro Higashi

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Seiichi Miyazaki

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