Akio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. IEICE Transactions, 95-C(5):879-884, 2012. [doi]
Abstract is missing.