Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara. A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. In Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan. pages 331-334, ACM, 2001. [doi]
@inproceedings{OhtakeNWF01,
title = {A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability},
author = {Satoshi Ohtake and Shintaro Nagai and Hiroki Wada and Hideo Fujiwara},
year = {2001},
doi = {10.1145/370155.370371},
url = {http://doi.acm.org/10.1145/370155.370371},
tags = {rule-based, completeness, testing},
researchr = {https://researchr.org/publication/OhtakeNWF01},
cites = {0},
citedby = {0},
pages = {331-334},
booktitle = {Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
publisher = {ACM},
isbn = {0-7803-6634-4},
}