Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara. A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. In Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan. pages 331-334, ACM, 2001. [doi]
Abstract is missing.