A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms - researchr publication

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Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara. A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 10310-10315, IEEE Computer Society, 2003. [doi]

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