Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara. A non-scan DFT method at register-transfer level to achieve complete fault efficiency. In Proceedings of ASP-DAC 2000, Asia and South Pacific Design Automation Conference 2000, Yokohama, Japan. pages 599-604, ACM, 2000. [doi]
Abstract is missing.