On Comparing Mutation Testing Tools through Learning-based Mutant Selection

Milos Ojdanic, Ahmed Khanfir, Aayush Garg, Renzo Degiovanni, Mike Papadakis, Yves Le Traon. On Comparing Mutation Testing Tools through Learning-based Mutant Selection. In IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023. pages 35-46, IEEE, 2023. [doi]

Authors

Milos Ojdanic

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Ahmed Khanfir

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Aayush Garg

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Renzo Degiovanni

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Mike Papadakis

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Yves Le Traon

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