Milos Ojdanic, Ahmed Khanfir, Aayush Garg, Renzo Degiovanni, Mike Papadakis, Yves Le Traon. On Comparing Mutation Testing Tools through Learning-based Mutant Selection. In IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023. pages 35-46, IEEE, 2023. [doi]
Abstract is missing.