Milos Ojdanic, Ahmed Khanfir, Aayush Garg, Renzo Degiovanni, Mike Papadakis, Yves Le Traon. On Comparing Mutation Testing Tools through Learning-based Mutant Selection. In IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023. pages 35-46, IEEE, 2023. [doi]
@inproceedings{OjdanicKGDPT23,
title = {On Comparing Mutation Testing Tools through Learning-based Mutant Selection},
author = {Milos Ojdanic and Ahmed Khanfir and Aayush Garg and Renzo Degiovanni and Mike Papadakis and Yves Le Traon},
year = {2023},
doi = {10.1109/AST58925.2023.00008},
url = {https://doi.org/10.1109/AST58925.2023.00008},
researchr = {https://researchr.org/publication/OjdanicKGDPT23},
cites = {0},
citedby = {0},
pages = {35-46},
booktitle = {IEEE/ACM International Conference on Automation of Software Test, AST 2023, Melbourne, Australia, May 15-16, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2402-0},
}