Erik Öjefors, Neda Baktash, Yan Zhao, Richard Al Hadi, Hani Sherry, Ullrich R. Pfeiffer. Terahertz imaging detectors in a 65-nm CMOS SOI technology. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 486-489, IEEE, 2010. [doi]
@inproceedings{OjeforsBZHSP10,
title = {Terahertz imaging detectors in a 65-nm CMOS SOI technology},
author = {Erik Öjefors and Neda Baktash and Yan Zhao and Richard Al Hadi and Hani Sherry and Ullrich R. Pfeiffer},
year = {2010},
doi = {10.1109/ESSCIRC.2010.5619749},
url = {https://doi.org/10.1109/ESSCIRC.2010.5619749},
researchr = {https://researchr.org/publication/OjeforsBZHSP10},
cites = {0},
citedby = {0},
pages = {486-489},
booktitle = {36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010},
publisher = {IEEE},
isbn = {978-1-4244-6662-7},
}