Erik Öjefors, Neda Baktash, Yan Zhao, Richard Al Hadi, Hani Sherry, Ullrich R. Pfeiffer. Terahertz imaging detectors in a 65-nm CMOS SOI technology. In 36th European Solid-State Circuits Conference, ESSCIRC 2010, Sevilla, Spain, September 13-17, 2010. pages 486-489, IEEE, 2010. [doi]
Abstract is missing.