Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera. A Statistical Gate-Delay Model Considering Intra-Gate Variability. In 2003 International Conference on Computer-Aided Design (ICCAD 03), November 9-13, 2003, San Jose, CA, USA. pages 908-913, IEEE Computer Society / ACM, 2003. [doi]
Abstract is missing.