Sho Okazaki, Shouhei Shirafuji, Toshinori Yasui, Jun Ota 0001. A Framework to Support Failure Cause Identification in Manufacturing Systems through Generalization of Past FMEAs. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2023, Seattle, WA, USA, June 28-30, 2023. pages 858-865, IEEE, 2023. [doi]
@inproceedings{OkazakiSYO23,
title = {A Framework to Support Failure Cause Identification in Manufacturing Systems through Generalization of Past FMEAs},
author = {Sho Okazaki and Shouhei Shirafuji and Toshinori Yasui and Jun Ota 0001},
year = {2023},
doi = {10.1109/AIM46323.2023.10196264},
url = {https://doi.org/10.1109/AIM46323.2023.10196264},
researchr = {https://researchr.org/publication/OkazakiSYO23},
cites = {0},
citedby = {0},
pages = {858-865},
booktitle = {IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2023, Seattle, WA, USA, June 28-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-7633-1},
}