Sho Okazaki, Shouhei Shirafuji, Toshinori Yasui, Jun Ota 0001. A Framework to Support Failure Cause Identification in Manufacturing Systems through Generalization of Past FMEAs. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2023, Seattle, WA, USA, June 28-30, 2023. pages 858-865, IEEE, 2023. [doi]
Abstract is missing.