Thomas Olbrich, Jordi Pérez, Ian A. Grout, Andrew M. D. Richardson, Carles Ferrer. Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 511-520, IEEE Computer Society, 1996.
Abstract is missing.