Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis 0001, Rafael B. Schvittz, Cristina Meinhardt. Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. In 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2022, Porto Alegre, Brazil, August 22-26, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.