Mauro Olivieri, Giuseppe Scotti, Alessandro Trifiletti. A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control. IEEE Trans. VLSI Syst., 13(5):630-638, 2005. [doi]
@article{OlivieriST05:0,
title = {A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control},
author = {Mauro Olivieri and Giuseppe Scotti and Alessandro Trifiletti},
year = {2005},
doi = {10.1109/TVLSI.2005.844290},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2005.844290},
tags = {optimization, design},
researchr = {https://researchr.org/publication/OlivieriST05%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {13},
number = {5},
pages = {630-638},
}