A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control - researchr publication

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Mauro Olivieri, Giuseppe Scotti, Alessandro Trifiletti. A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control. IEEE Trans. VLSI Syst., 13(5):630-638, 2005. [doi]

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