Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida. Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 122-125, IEEE Computer Society, 1997. [doi]
Abstract is missing.