Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko. Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 216-221, IEEE Computer Society, 2008. [doi]
Abstract is missing.