Identifying Systematic Failures on Semiconductor Wafers Using ADCAS

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan. Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Design & Test of Computers, 30(5):44-53, 2013. [doi]

Abstract

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