Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski. A Universal Technique for Accelerating Simulation of Scan Test Patterns. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 135-141, IEEE Computer Society, 1996.
@inproceedings{OommanCW96,
title = {A Universal Technique for Accelerating Simulation of Scan Test Patterns},
author = {Bejoy G. Oomman and Wu-Tung Cheng and John A. Waicukauski},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/OommanCW96},
cites = {0},
citedby = {0},
pages = {135-141},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}