Shigeyuki Oshima, Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara. On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 30-35, IEEE, 2018. [doi]
Abstract is missing.