A novel random approach to diagnostic test generation

Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik. A novel random approach to diagnostic test generation. In IEEE Nordic Circuits and Systems Conference, NORCAS 2016, Copenhagen, Denmark, November 1-2, 2016. pages 1-4, IEEE, 2016. [doi]

Authors

Emmanuel Ovie Osimiry

This author has not been identified. Look up 'Emmanuel Ovie Osimiry' in Google

Raimund Ubar

This author has not been identified. Look up 'Raimund Ubar' in Google

Sergei Kostin

This author has not been identified. Look up 'Sergei Kostin' in Google

Jaan Raik

This author has not been identified. Look up 'Jaan Raik' in Google