Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik. A novel random approach to diagnostic test generation. In IEEE Nordic Circuits and Systems Conference, NORCAS 2016, Copenhagen, Denmark, November 1-2, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{OsimiryUKR16,
title = {A novel random approach to diagnostic test generation},
author = {Emmanuel Ovie Osimiry and Raimund Ubar and Sergei Kostin and Jaan Raik},
year = {2016},
doi = {10.1109/NORCHIP.2016.7792915},
url = {http://dx.doi.org/10.1109/NORCHIP.2016.7792915},
researchr = {https://researchr.org/publication/OsimiryUKR16},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE Nordic Circuits and Systems Conference, NORCAS 2016, Copenhagen, Denmark, November 1-2, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1095-0},
}