Modeling timing constraints for automatic generation of embedded test instruments

Steffen Ostendorff, Jorge H. Meza Escobar, Heinz-Dietrich Wuttke, T. Sasse, S. Richter. Modeling timing constraints for automatic generation of embedded test instruments. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 201-206, IEEE, 2014. [doi]

@inproceedings{OstendorffEWSR14,
  title = {Modeling timing constraints for automatic generation of embedded test instruments},
  author = {Steffen Ostendorff and Jorge H. Meza Escobar and Heinz-Dietrich Wuttke and T. Sasse and S. Richter},
  year = {2014},
  doi = {10.1109/DDECS.2014.6868790},
  url = {http://dx.doi.org/10.1109/DDECS.2014.6868790},
  researchr = {https://researchr.org/publication/OstendorffEWSR14},
  cites = {0},
  citedby = {0},
  pages = {201-206},
  booktitle = {17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-4560-3},
}