Steffen Ostendorff, Jorge H. Meza Escobar, Heinz-Dietrich Wuttke, T. Sasse, S. Richter. Modeling timing constraints for automatic generation of embedded test instruments. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 201-206, IEEE, 2014. [doi]
Abstract is missing.