Timm Ostermann, Bernd Deutschmann. Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 132-137, IEEE Computer Society, 2003. [doi]
@inproceedings{OstermannD03-0,
title = {Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]},
author = {Timm Ostermann and Bernd Deutschmann},
year = {2003},
doi = {10.1109/ETW.2003.1231680},
url = {https://doi.org/10.1109/ETW.2003.1231680},
researchr = {https://researchr.org/publication/OstermannD03-0},
cites = {0},
citedby = {0},
pages = {132-137},
booktitle = {8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003},
publisher = {IEEE Computer Society},
isbn = {0-7695-1908-3},
}