Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application

D. Othman, M. Bouarroudj-Berkani, Stéphane Lefebvre, A. Ibrahim, Zoubir Khatir, A. Bouzourene. Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. Microelectronics Reliability, 52(9-10):1859-1864, 2012. [doi]

Authors

D. Othman

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M. Bouarroudj-Berkani

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Stéphane Lefebvre

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A. Ibrahim

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Zoubir Khatir

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A. Bouzourene

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