D. Othman, M. Bouarroudj-Berkani, Stéphane Lefebvre, A. Ibrahim, Zoubir Khatir, A. Bouzourene. Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. Microelectronics Reliability, 52(9-10):1859-1864, 2012. [doi]
@article{OthmanBLIKB12,
title = {Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application},
author = {D. Othman and M. Bouarroudj-Berkani and Stéphane Lefebvre and A. Ibrahim and Zoubir Khatir and A. Bouzourene},
year = {2012},
doi = {10.1016/j.microrel.2012.06.078},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.078},
researchr = {https://researchr.org/publication/OthmanBLIKB12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {1859-1864},
}