Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application

D. Othman, M. Bouarroudj-Berkani, Stéphane Lefebvre, A. Ibrahim, Zoubir Khatir, A. Bouzourene. Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. Microelectronics Reliability, 52(9-10):1859-1864, 2012. [doi]

Abstract

Abstract is missing.