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Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes

Mourad Oualli, Christian Dua, O. Patard, P. Altuntas, S. Piotrowicz, Piero Gamarra, C. Lacam, J.-C. Jacquet, L. Teisseire, D. Lancereau, E. Chartier, C. Potier, Sylvain L. Delage. Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. Microelectronics Reliability, 88:418-422, 2018. [doi]

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Mourad Oualli

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Christian Dua

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O. Patard

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P. Altuntas

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S. Piotrowicz

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Piero Gamarra

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C. Lacam

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J.-C. Jacquet

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L. Teisseire

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D. Lancereau

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E. Chartier

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C. Potier

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Sylvain L. Delage

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